Do you find yourself with insufficient test capacity, missing a vital piece of test equipment to measure an obscure test parameter? Or simply an inability to perform some of the testing required for one reason or another? Linwave can help by automation and upgrading of existing test routines, design of test sequences for product approvals, or simply by manual characterisation and benchmarking. Our preferred ATE development platform is LabVIEW , but HP VEE and C/C++ capability is also supported. For more detail click here Linwave has a comprehensive test and measurement capability for a wide range of RF and microwave products. We have the ability to measuremost parameters to 50GHz. We also have the ability to perform temperature testing of components and modules along with both powered and un-powered random vibration testing. Virtually all of our main test equipment is current model HP/Agilent, with established test platforms for discriminator and phase comparison based phase noise measurement, vector and scalar network analysis, spectrum analysis, noise figure and vector modulated radio system tests. This is supplemented by active and passive temperature and vibration screening capabilities. Spectrum Analysis - Agilent E4400A/8565E to 50GHz with ACPR/phase noise firmware
Network Analysis - Agilent 8722ES vector and 8757D scalar to 50GHz
Frequency Sources - Agilent modulated and swept sources to 50GHz Noise Figure Measurement - Agilent N8973A and sources to 50GHz
Power Measurement - Agilent and Gigatronics to 50GHz
Phase Noise Measurement - Agilent and Aeroflex RDL to 26GHz
Time Domain - Agilent and LeCroy scopes to 500MHz
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